Design, fabrication, and characterization of kinetic-inductive force sensors for scanning probe applications

• August K. Roos,
• Ermes Scarano,
• Elisabet K. Arvidsson,
• Erik Holmgren and
• David B. Haviland

Beilstein J. Nanotechnol. 2024, 15, 242–255, doi:10.3762/bjnano.15.23

• superconducting cavity read-out scheme is intrinsically low noise. Compared to other low-temperature AFM probes, such as the qPlus sensor [42], our versatile design allows for achieving a wide variety of the parameters of the mechanical mode (force transducer) with a much lower effective mass and, consequently

Quantitative wear evaluation of tips based on sharp structures

• Ke Xu and
• Houwen Leng

Beilstein J. Nanotechnol. 2024, 15, 230–241, doi:10.3762/bjnano.15.22

• shown in Figure 6. The crest’s location in the plane view indicates potential tips of structures. Images of the AFM probes were acquired using a Thermo Fisher Scientific Quattro model scanning electron microscope system. The imaging parameters for the SEM were set to 20 kV electron beam voltage with a

Determination of the radii of coated and uncoated silicon AFM sharp tips using a height calibration standard grating and a nonlinear regression function

• Perawat Boonpuek and
• Jonathan R. Felts

Beilstein J. Nanotechnol. 2023, 14, 1200–1207, doi:10.3762/bjnano.14.99

• strongly depend on the geometry of the AFM tip [7][8]. For example, the Pt-coated HQ:NSC18/Pt tip (for electrical force modulation AFM probes) and the Cr/Au-coated HQ:NSC16/Cr-Au tip (for tapping mode AFM probes with long AFM cantilever) produced by MikroMasch [9] have estimated nominal tip radii lower

On the use of Raman spectroscopy to characterize mass-produced graphene nanoplatelets

• Keith R. Paton,
• Konstantinos Despotelis,
• Naresh Kumar,
• Piers Turner and
• Andrew J. Pollard

Beilstein J. Nanotechnol. 2023, 14, 509–521, doi:10.3762/bjnano.14.42

• Research, Oxford Instruments, UK). AFM images were recorded using Si AFM probes (MikroMasch HQ:NSC15, 40 N/m, 325 kHz, MikroMasch, Bulgaria) in tapping-mode feedback. AFM images were measured in square areas between 6 μm × 6 μm and 8 μm × 8 μm using 1024 × 1024 pixels with a scan speed below 20 μm·s−1. To

Studies of probe tip materials by atomic force microscopy: a review

• Ke Xu and
• Yuzhe Liu

Beilstein J. Nanotechnol. 2022, 13, 1256–1267, doi:10.3762/bjnano.13.104

• Ke Xu Yuzhe Liu School of Electrical & Control Engineering, Shenyang Jianzhu University, Shenyang 110168, China 10.3762/bjnano.13.104 Abstract As a tool that can test insulators' surface morphology and properties, the performance index of atomic force microscope (AFM) probes is the most critical

• and disadvantages of the improved probes compared with ordinary probes by comparing the differences in spatial resolution, sensitivity, imaging, and other performance aspects, and finally provides an outlook on the future development of AFM probes. This paper promotes the development of AFM probes in

• interaction force between the particle and the surface. A new colloidal AFM probe was proposed by Daboss et al. [14]. These conductive spherical boron-doped diamond (BDD)-AFM probes allow electrochemical force spectroscopy. The physical robustness of these bifunctional probes and the excellent electrochemical

Bulk chemical composition contrast from attractive forces in AFM force spectroscopy

• Dorothee Silbernagl,
• Media Ghasem Zadeh Khorasani,
• Natalia Cano Murillo,
• Anna Maria Elert and
• Heinz Sturm

Beilstein J. Nanotechnol. 2021, 12, 58–71, doi:10.3762/bjnano.12.5

• File 1. The AFM probes used were: Tip A (sQube, CP-NCH-SiO_A Nanoandmore, Wetzlar, Germany) with kc = 38 N/m and R = 2 µm; tip B (HQ: NSC35, Mikromasch, Wetzlar, Germany) with kc = 14.2 N/m and R = 23 nm; tip C (Pointprobe plus, PPP-NCHR, Nanosnesors Neuchâtel, Switzerland) with kc = 51 N/m and R = 230

Quantitative determination of the interaction potential between two surfaces using frequency-modulated atomic force microscopy

• Nicholas Chan,
• Carrie Lin,
• Tevis Jacobs,
• Robert W. Carpick and
• Philip Egberts

Beilstein J. Nanotechnol. 2020, 11, 729–739, doi:10.3762/bjnano.11.60

• generated using the 6-12 LJ pair potential form and experimental tip apex geometry, which was extracted from two-dimensional transmission electron microscopy (TEM) images. In prior works, the shapes of AFM probes have been determined using field ion microscopy (FIM) [39], atom probe tomography (APT) [40

Current measurements in the intermittent-contact mode of atomic force microscopy using the Fourier method: a feasibility analysis

• Berkin Uluutku and
• Santiago D. Solares

Beilstein J. Nanotechnol. 2020, 11, 453–465, doi:10.3762/bjnano.11.37

• existing commercial devices with this type of excitation cannot always provide reliable and sufficiently strong excitation suitable for all types of AFM probes. This has, in fact, been the case when we have attempted to drive solid platinum probes in our laboratory, for which our thermal excitation did not

Integration of sharp silicon nitride tips into high-speed SU8 cantilevers in a batch fabrication process

• Nahid Hosseini,
• Matthias Neuenschwander,
• Oliver Peric,
• Santiago H. Andany,
• Jonathan D. Adams and
• Georg E. Fantner

Beilstein J. Nanotechnol. 2019, 10, 2357–2363, doi:10.3762/bjnano.10.226

• Kokavecz et al. and Sulcheck and co-workers [36][37]. Figure 3a shows a comparison of the bandwidths of the individual cantilevers, namely the commercial RTESPA (Bruker AFM probes, Camarillo, CA, USA) with f0 = 339 kHz, k = 48 N/m, Q = 592, planar dimensions of 125 × 40 µm and a thickness of 3.4 µm, and

In situ AFM visualization of Li–O₂ battery discharge products during redox cycling in an atmospherically controlled sample cell

• Kumar Virwani,
• Younes Ansari,
• Khanh Nguyen,
• Francisco José Alía Moreno-Ortiz,
• Jangwoo Kim,
• Maxwell J. Giammona,
• Ho-Cheol Kim and
• Young-Hye La

Beilstein J. Nanotechnol. 2019, 10, 930–940, doi:10.3762/bjnano.10.94

• in this study. AC 160TS AFM probes from Olympus were used for all the experiments and were secured to the probe holder with a polyetheretherketone (PEEK) clip. The glassy carbon for the AFM experiments was obtained from Tokai carbon products and was certified to have alkali metal impurities less than

Advanced scanning probe lithography using anatase-to-rutile transition to create localized TiO₂ nanorods

• Julian Kalb,
• Vanessa Knittel and
• Lukas Schmidt-Mende

Beilstein J. Nanotechnol. 2019, 10, 412–418, doi:10.3762/bjnano.10.40

• probe lithography was performed with an Innova AFM (Bruker) in contact mode. The applied force was significantly higher than usually chosen for topography scanning. We used OTESPA-R3 (Bruker AFM probes) silicon tips with a spring constant of approximately 26 N/m. Based on the spring constant, we

Characterization and influence of hydroxyapatite nanopowders on living cells

• Przemyslaw Oberbek,
• Tomasz Bolek,
• Adrian Chlanda,
• Seishiro Hirano,
• Sylwia Kusnieruk,
• Julia Rogowska-Tylman,
• Ganna Nechyporenko,
• Viktor Zinchenko,
• Wojciech Swieszkowski and
• Tomasz Puzyn

Beilstein J. Nanotechnol. 2018, 9, 3079–3094, doi:10.3762/bjnano.9.286

• taken with 0.8 Hz scan rate using a silicon probe (k = 40 N/m, r = 10 nm) from Bruker AFM Probes [36]. Image analysis and measurement of length, width and height of the HAp particles was performed with the Gwyddion software [37]. The tip-broadening error was removed by using a method described by Kacher

Characterization of the microscopic tribological properties of sandfish (Scincus scincus) scales by atomic force microscopy

• Weibin Wu,
• Christian Lutz,
• Simon Mersch,
• Richard Thelen,
• Christian Greiner,
• Guillaume Gomard and
• Hendrik Hölscher

Beilstein J. Nanotechnol. 2018, 9, 2618–2627, doi:10.3762/bjnano.9.243

• microtribometer experiments. Using different types of AFM probes we do not observe favourable frictional properties of sandfish scales if compared to technical surfaces with tribological relevance. Even a direct comparison with scales of various snakes does not reveal superior features. Experiments with a

• unusually high compared to other reptiles or insects and do not suggest low surface energy or low adhesion. We, therefore, examined the adhesion of sandfish scales in more detail. Adhesion properties Several different types of AFM probes were utilised to measure the adhesion force on dorsal scales. Figure

Magnetic properties of Fe₃O₄ antidot arrays synthesized by AFIR: atomic layer deposition, focused ion beam and thermal reduction

• Juan L. Palma,
• Alejandro Pereira,
• Raquel Álvaro,
• José Miguel García-Martín and
• Juan Escrig

Beilstein J. Nanotechnol. 2018, 9, 1728–1734, doi:10.3762/bjnano.9.164

• been performed using a Bruker Dimension Icon microscope operating in non-contact mode and commercial AFM probes (Nanosensors, type PPP-FM), while scanning electron microscopy (SEM) images have been obtained using a Zeiss EVO MA10 microscope. The thickness of the thin films was determined using an alpha

Tuning adhesion forces between functionalized gold colloidal nanoparticles and silicon AFM tips: role of ligands and capillary forces

• Sven Oras,
• Sergei Vlassov,
• Marta Berholts,
• Rünno Lõhmus and
• Karine Mougin

Beilstein J. Nanotechnol. 2018, 9, 660–670, doi:10.3762/bjnano.9.61

• to take all aspects into account and give decisive explanation of the obtained results and broad scattering of measured values. Possible reasons may include deviation of NPs geometry from spherical shape, variation of the tip radii between different AFM probes, contamination and wear of the AFM tip

Increasing the stability of DNA nanostructure templates by atomic layer deposition of Al₂O₃ and its application in imprinting lithography

• Hyojeong Kim,
• Kristin Arbutina,
• Anqin Xu and
• Haitao Liu

Beilstein J. Nanotechnol. 2017, 8, 2363–2375, doi:10.3762/bjnano.8.236

• different locations. Atomic Force Microscopy: The surface morphologies of a DNA nanostructure master template and a PLLA stamp at each step of fabrication process were imaged using tapping-mode on an MFP-3D atomic force microscope with RTESPA-300, NSC15/Al BS, or SSS-FMR-SPL AFM probes in air at room

• temperature (Oxford Instruments Asylum Research, Inc., Santa Barbara, CA, USA). The RTESPA-300 (300 kHz, 40 N/m) and NSC15/AL BS (325 kHz, 40 N/m) AFM probes were purchased from Bruker (Camarillo, CA, USA) and MikroMasch (Lady’s Island, SC, USA), respectively, and used to scan the DNA nanotube master

A comparative study of the nanoscale and macroscale tribological attributes of alumina and stainless steel surfaces immersed in aqueous suspensions of positively or negatively charged nanodiamonds

• Colin K. Curtis,
• Antonin Marek,
• Alex I. Smirnov and
• Jacqueline Krim

Beilstein J. Nanotechnol. 2017, 8, 2045–2059, doi:10.3762/bjnano.8.205

• topology characterization of the QCM electrodes was performed with an Asylum Research MFP 3D AFM equipped with silicon nitride tips (part#NCHV-A, Bruker AFM Probes, Camarillo, CA) and operated in a tapping mode. The 1024 × 1024 images were recorded at a rate of 1 line/s yielding a height profile h = h(xi

Customized MFM probes with high lateral resolution

• Óscar Iglesias-Freire,
• Miriam Jaafar,
• Eider Berganza and
• Agustina Asenjo

Beilstein J. Nanotechnol. 2016, 7, 1068–1074, doi:10.3762/bjnano.7.100

• ); AFM probes; high-resolution microscopy; magnetic force microscopy (MFM); magnetic materials; Introduction Conventional MFM probes consist of pyramidal Si or SiN tips with a ferromagnetic thin film coating (generally a CoCr alloy) mounted on a cantilever with resonance frequency and spring constant of

• tips with high lateral resolution and a controlled influence in the sample by using a fast and rather accessible approach. Our method is based on easily preparing MFM probes from commercial AFM probes by using a specific coating. By doing so, we can tune the amount of magnetic material in the probe and

• tip with a 20 nm thick coating. Figure 3a shows grains of the order of 10 nm in size, a remarkable resolution even for non-magnetic AFM probes. The corresponding MFM image shows series of bright and dark stains associated to domains with alternate OOP magnetization (Figure 3b). The frequency shift

Nanoscale rippling on polymer surfaces induced by AFM manipulation

• Mario D’Acunto,
• Franco Dinelli and
• Pasqualantonio Pingue

Beilstein J. Nanotechnol. 2015, 6, 2278–2289, doi:10.3762/bjnano.6.234

• the ripple patterning only when it is desired. Conclusive remarks and future perspectives In conclusion, the phenomenon of nanoripple formation on polymeric films via contact with AFM probes has been extensively studied in the past decades. The key parameters ruling this physical process have been

Development of a novel nanoindentation technique by utilizing a dual-probe AFM system

• Eyup Cinar,
• Ferat Sahin and
• Dalia Yablon

Beilstein J. Nanotechnol. 2015, 6, 2015–2027, doi:10.3762/bjnano.6.205

• multi-probe system inside the acoustic chamber. Experimental setup demonstrating the proposed two probe nanoindentation technique. An example resonance response of AFM probes used in the experiments. Experimental data showing AFM probe measurements on top of the diamond indenter for a fused silica

Magnetic properties of self-organized Co dimer nanolines on Si/Ag(110)

• Lisa Michez,
• Kai Chen,
• Fabien Cheynis,
• Frédéric Leroy,
• Alain Ranguis,
• Haik Jamgotchian,
• Margrit Hanbücken and
• Laurence Masson

Beilstein J. Nanotechnol. 2015, 6, 777–784, doi:10.3762/bjnano.6.80

• ]. We note that these protrusions are too large to represent individual atoms. We have recently shown that neither STM nor non-contact atomic force microscopy (nc-AFM) probes can straightforwardly resolve the inner atomic structure of the Si NRs [25]. All NRs, varying only in length, present the same

Boosting the local anodic oxidation of silicon through carbon nanofiber atomic force microscopy probes

• Gemma Rius,
• Matteo Lorenzoni,
• Soichiro Matsui,
• Masaki Tanemura and
• Francesc Perez-Murano

Beilstein J. Nanotechnol. 2015, 6, 215–222, doi:10.3762/bjnano.6.20

• tip apex of AFM probes for the application of LAO on silicon substrates in the AFM amplitude modulation dynamic mode of operation. We show the good performance of CNF-AFM probes in terms of resolution and reproducibility, as well as demonstration that the CNF apex provides enhanced conditions in terms

• control upon making CNT probes, as well as characteristic tip-to-tip differences, such as length, diameter, and operational complications, such as CNT buckling [15][16]. In this work, we explore the use of a carbon nanofiber (CNF) as the tip apex of AFM probes for the application of LAO-AFM on silicon

• -irradiation upon commercial AFM silicon probes [17][18]. We do not only show the good performance of CNF-AFM probes for LAO-AFM in terms of resolution and reproducibility, but our experimental results demonstrate that CNF apex provides enhanced conditions in terms of field-induced chemical process efficiency

High-frequency multimodal atomic force microscopy

• Adrian P. Nievergelt,
• Jonathan D. Adams,
• Pascal D. Odermatt and
• Georg E. Fantner

Beilstein J. Nanotechnol. 2014, 5, 2459–2467, doi:10.3762/bjnano.5.255

• the total liquid volume surrounding the cantilever and generally yields a much cleaner drive. Figure 3a illustrates this effect. A FastScan C cantilever (Bruker AFM Probes, Camarillo, CA, USA) was placed in a hanging water droplet and alternately driven with photothermal and piezo excitation. The

• high frequencies by using a FastScan A cantilever (Bruker AFM probes). Figure 3b shows the driven response of the cantilever with clearly detected resonant modes up to 20 MHz (blue curve). The first three flexural modes, the first two torsional modes, and a complex higher mode are visible. The lower

• squeeze-film damping of the cantilever, the latter of which is roughly constant while in feedback. We used a thin-film blend of polystyrene (PS) and poly(methyl methacrylate) (PMMA) as a sample (PS–PMMA–15M, Bruker AFM probes); its separation into soft and hard domains makes it a widely used standard for

Modification of a single-molecule AFM probe with highly defined surface functionality

• Fei Long,
• Bin Cao,
• Ashok Khanal,
• Shiyue Fang and
• Reza Shahbazian-Yassar

Beilstein J. Nanotechnol. 2014, 5, 2122–2128, doi:10.3762/bjnano.5.221

• double-stranded RNA and DNA molecules [12]. Despite all the success in these studies, one significant challenge remains in AFM-based SMFS, that is to attach only one or a few molecules to the AFM probes. In previous studies, the most common method depended on non-specific adhesions [13][14], which

• reported the pioneer work of using this ‘click’ reaction to modify AFM probes, taking advantage of the mild reaction condition and simple operation [18]. However, this method is based on a bulk solution and loses the ‘spatial resolution’ in terms of functionality, since the reaction happens anywhere on the

• persistence length of 0.35–0.40 nm, shown as green solid lines in Figure 2. This persistence length agreed well with the extension behavior of PEG molecule [22]. Therefore, it was reasonable to believe that carboxylic groups from the azide molecules had been ‘clicked’ onto the AFM probes through our method

Optical properties and electrical transport of thin films of terbium(III) bis(phthalocyanine) on cobalt

• Peter Robaschik,
• Pablo F. Siles,
• Daniel Bülz,
• Peter Richter,
• Manuel Monecke,
• Michael Fronk,
• Svetlana Klyatskaya,
• Daniel Grimm,
• Oliver G. Schmidt,
• Mario Ruben,
• Dietrich R. T. Zahn and
• Georgeta Salvan

Beilstein J. Nanotechnol. 2014, 5, 2070–2078, doi:10.3762/bjnano.5.215

• of the Pt-coated AFM probes used in this work [26]. Applying this geometry-corrected model to our current density measurements, it is possible to quantify the charge carrier mobility for the TbPc2 thin films on a nanometer scale. The values of L and Pd are fixed by the film thickness and tip geometry